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EMC Measurement Technology

LangerSX near-field probes enable electromagnetic compatibility (EMC) analyses of interferences emitted by electronic boards, components, and IC pins with high internal frequencies. The SX-R3-1 magnetic H-field probe is designed to detect high-frequency magnetic fields with a high geometrical resolution. The field orientation and distribution can be detected by moving the probe around conductor runs, bypass capacitors, EMC components, and within IC pin and supply system areas. The SX-E03 E-field probe detects bus structures and larger components.

The probes have a 1-to-10-GHz frequency range. Their high resolution (the SX R3-1 achieves 1 mm and the SX E03 covers up to 4 mm × 4 mm) enables them to pinpoint RF sources on densely packed boards or on IC pins. The magnetic-field probe heads are electrically shielded. The probes are connected to a spectrum analyzer input via a shielded cable and SMA connectors during measurement. High clock rates of 2 GHz, for example, may result in fifth-order harmonics of up to 10 GHz. These harmonics are coupled out by RF sources on the board (e.g., conductor-run segments, ICs, and other components). They may stimulate other structural parts of the board to oscillate and emit interferences.

Contact Langer for pricing.

Langer EMV-Technik
www.langer-emv.com

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EMC Measurement Technology

by Circuit Cellar Staff time to read: 1 min