The AWG18 is an arbitrary waveform generator designed for use with Applicos’s ATX-series of test systems. The waveform generator features an 18-bit resolution at a 300 megasamples-per-second (MSPS) data rate and oversampling at a 600-MSPS or 1.2 gigasamples-per-second (GSPS) rate.
Testing analog systems with high-speed 14- and 16-bit data converters requires extremely clean signals. The traditional approach of filtering away the harmonics is insufficient when dealing with a high signal-to-noise ratio (SNR), maintaining a high spurious-free dynamic range (SFDR), or when a low “close-in carrier noise” is preferred. In these cases, the extra precision from an 18-bit signal value can create a reliable test-stand operation and reduce random failures.
Many applications need to use signals other than sine waves to make additional time domain measurements. To accommodate this, the AWG18 has two signal paths: one path starts at DC for time domain and general-purpose measurements that require high-level accuracy. The other path runs from 10 to 100 MHz and is optimized for dynamic signal generation in this frequency range. The typical total harmonic distortion (THD) for frequencies up to 50 MHz is above 100 dBc.
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